( bucko | 2015. 10. 06., k – 12:33 )

Magyarázatod megalapozatlan. :(

An immediate (or catastrophic) failure occurs when ESD damages the part and renders the part useless immediately after the ESD event. This type of failure would require replacement of the damaged part before any further testing could be accomplished.

A latent failure occurs when the ESD damage is not severe enough to require replacement of the part. This type of failure may be noticed as a glitch in the signal, which only occurs for a microsecond. Further testing may not indicate any damage to the part and operators assume the part to be acceptable. The ESD damage caused the part to fail intermittently whereby a defect was not detected; however, over time and use, the part may degrade until it causes a permanent failure.

Forrás - ugyanitt tök jó pásztázó elektronmikroszkópos felvételek. Ezek azért nem új információk. Ehhez hasonló szakirodalmat már olvastam már a 80-as években is.

Azt a 80-100A körüli áramot meg pont azért, mert nics ehhez megfelelő kondenzátor, nem egyszerű kapcsolóstáppal, hanem pl. 8-12 fázisú táppal állítják elő.